|
Equipment |
Analyzes |
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Ozone generator and ozone reactor |
Advanced oxidation studies |
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Capillary suction time meter |
Capillary suction time measurement |
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Viscometer |
Viscosity measurement |
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DGGE (Denaturer Gradient Gel Electrophoresis) device |
Microbial community analyzes |
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Ion chromatography |
Nitrite, Nitrate, Sulfate and Chloride Analysis |
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High Performance Liquid Chromatography |
Analysis of organics (varies by column) |
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Cross flow nanofiltration and reverse osmosis system |
Filterability and Regain studies |
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Dead-end filtration system |
Filterability test |
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Fluorescent Microscope |
RGB imaging of fluorescently labeled cells and sections |
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UV-VIS Spectrophotometer (SHIMADZU UV-2600) |
Measuring the absorption of photoactive group-bearing materials in the UV-Visible region |
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Fluorescence Spectrophotometer (CARY ECLIPSE BUNDLE A-G9800AA) |
Obtaining the emission and excitation fluorescence spectrum of fluorescent substances |
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Gel Permeation Chromatography (GPC) (AGILENT TECHNOLOGIES 1260 INFINITY GPC/SEC MDS) |
Measuring molecular weights of polymeric materials |
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Gas Chromatography (GC) (THERMO SCIENTIFIC TRACE 1310) |
Qualitative and quantitative analysis of gases and volatile substances |
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FT-IR Spectrophotometer (PERKIN ELMER SPECTRUM 2) |
Structural analysis of the material at the molecular level |
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DSC Calorimeter (PERKIN ELMER, DSC 8500) |
Determination of thermal behavior of materials |
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Thermogravimetric Analyzer (TGA)(PERKIN ELMER, STA6000 ) |
Measurement of mass loss of materials with temperature |
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Centrifuge (HETTICH, EBA-200) |
Separation of mixtures by centrifugal force |
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Computer Controlled Battery Charge-Discharger (MTI, BSTS8-WA) |
Battery analyzes |
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Rotational Viscometer System (Lamy Rheology, RM 100 Touch CP 2000) |
Viscosity measurements |
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3D Printer |
|
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Electrospinning (Nanoweb ve Self-made) |
Nano/microfiber material |
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Centrifugal Spinning |
Nano/microfiber material |
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XRD (Bruker D8 Discover) |
Crystal phase identification |
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Dielectric Spectrometer (Novocontrol): |
Dielectric, conductivity, electrochemical, impedance. |
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Atomic Force Microscope (Park System XE-100E) |
Force Distance Spectroscopy, Phase Imaging |
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Spectroscopic Ellipsometer (J. A. Woollam Co. VASE) |
Thin film thickness, Surface map, Inhomogeneity Ratio, Surface Roughness, Interface Roughness measurements |
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GLOWBOX (MBRAUN) |
Glove box system |
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Thin Film System (Vaksis) |
It has a total of 3 welded sputter coatings: single source, two crucible thermal and two DC, one RF. |
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Sample Station (Cascade) |
Manual specimen holder with microscope for characterization, compatible with Keithley instruments. |
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Wire Connector Device (West-Band 747677E) |
Manual wire binding device. |
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Shaker Mill (Spex Sample Prep Mixer/Mill 8000M) |
High energy Shaker Mill |
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Precision Sample Cutting Device |
Precise cutting of all materials by adjusting the cutting speed |
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Mini Arc Melting System (Edmund Bühler GmbH MAM- 1) |
Fast and pure alloying from electrically conductive materials in vacuum environment (application temperature up to 3500◦C). |
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Automatic Sanding and Polishing Device (Struer LaboPol-5): |
Sanding and polishing with adjustable speed of 50-500 rpm. |
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Mechanical Profilometer (Bruker DektakXT) |
Surface roughness and thickness measurements of films |
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Semiconductor Characterization Unit (4200-SCS/C Keithley) |
Easy-to-use Model 4200-SCS Semiconductor Characterization System |
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Helium Leak Detector (Adixen ASM340) |
Completely oil-free leak detection. Capable of detecting inlet test pressure and large leaks between 100hPa |
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BIPOLAR ELECTROMAGNETIC (GMW 5403) |
It is particularly suitable for Hall effect studies, magneto-optical measurements, and high-temperature, superconducting research. |
4 KELVIN COLD HEAD AND HELIUM COMPRESSOR (JANIS) |
Janis SHI-4 series cryostats are among the most efficient systems available for laboratory sample cooling. |
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DRILLING AND MILLING MACHINE WABECO F1200 HS |
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LATHE MACHINE WABECO D6000 HS |