Science and Advanced Technologies Research Center

Services

Equipment

Analyzes

Ozone generator and ozone reactor

Advanced oxidation studies

Capillary suction time meter

Capillary suction time measurement

Viscometer

Viscosity measurement

DGGE (Denaturer Gradient Gel Electrophoresis) device

Microbial community analyzes

Ion chromatography

Nitrite, Nitrate, Sulfate and Chloride Analysis

High Performance Liquid Chromatography

Analysis of organics (varies by column)

Cross flow nanofiltration and reverse osmosis system

Filterability and Regain studies

Dead-end filtration system

Filterability test

Fluorescent Microscope

RGB imaging of fluorescently labeled cells and sections

UV-VIS Spectrophotometer (SHIMADZU UV-2600)

Measuring the absorption of photoactive group-bearing materials in the UV-Visible region

Fluorescence Spectrophotometer (CARY ECLIPSE BUNDLE A-G9800AA)

Obtaining the emission and excitation fluorescence spectrum of fluorescent substances

Gel Permeation Chromatography (GPC) (AGILENT TECHNOLOGIES 1260 INFINITY GPC/SEC MDS)

Measuring molecular weights of polymeric materials

Gas Chromatography (GC) (THERMO SCIENTIFIC TRACE 1310)

Qualitative and quantitative analysis of gases and volatile substances

FT-IR Spectrophotometer (PERKIN ELMER SPECTRUM 2)

Structural analysis of the material at the molecular level

DSC Calorimeter (PERKIN ELMER, DSC 8500)

Determination of thermal behavior of materials

Thermogravimetric Analyzer (TGA)(PERKIN ELMER, STA6000 )

Measurement of mass loss of materials with temperature

Centrifuge (HETTICH, EBA-200)

Separation of mixtures by centrifugal force

Computer Controlled Battery Charge-Discharger (MTI, BSTS8-WA)

Battery analyzes

Rotational Viscometer System (Lamy Rheology, RM 100 Touch CP 2000)

Viscosity measurements

3D Printer

Electrospinning (Nanoweb ve Self-made)

Nano/microfiber material

Centrifugal Spinning

Nano/microfiber material

XRD (Bruker D8 Discover)

Crystal phase identification

Dielectric Spectrometer (Novocontrol):

Dielectric, conductivity, electrochemical, impedance.

Atomic Force Microscope (Park System XE-100E)

Force Distance Spectroscopy, Phase Imaging

Spectroscopic Ellipsometer (J. A. Woollam Co. VASE)

Thin film thickness, Surface map, Inhomogeneity Ratio, Surface Roughness, Interface Roughness measurements

GLOWBOX (MBRAUN)

Glove box system

Thin Film System (Vaksis)

It has a total of 3 welded sputter coatings: single source, two crucible thermal and two DC, one RF.

Sample Station (Cascade)

Manual specimen holder with microscope for characterization, compatible with Keithley instruments.

Wire Connector Device (West-Band 747677E)

Manual wire binding device.

Shaker Mill (Spex Sample Prep Mixer/Mill 8000M)

High energy Shaker Mill

Precision Sample Cutting Device

Precise cutting of all materials by adjusting the cutting speed

Mini Arc Melting System (Edmund Bühler GmbH        MAM- 1)

Fast and pure alloying from electrically conductive materials in vacuum environment (application temperature up to 3500◦C).

Automatic Sanding and Polishing Device (Struer  LaboPol-5):

Sanding and polishing with adjustable speed of 50-500 rpm.

Mechanical Profilometer (Bruker  DektakXT)

Surface roughness and thickness measurements of films

Semiconductor Characterization Unit (4200-SCS/C Keithley)

Easy-to-use Model 4200-SCS Semiconductor Characterization System

Helium Leak Detector (Adixen ASM340)

Completely oil-free leak detection. Capable of detecting inlet test pressure and large leaks between 100hPa

BIPOLAR ELECTROMAGNETIC (GMW 5403)

It is particularly suitable for Hall effect studies, magneto-optical measurements, and high-temperature, superconducting research.

4 KELVIN COLD HEAD AND HELIUM COMPRESSOR (JANIS)

Janis SHI-4 series cryostats are among the most efficient systems available for laboratory sample cooling.

DRILLING AND MILLING MACHINE WABECO F1200 HS

LATHE MACHINE WABECO D6000 HS